Title :
Efficient modeling and analysis of clock feed-through and charge injection of switched current circuits
Author :
Yuan, Fei ; Youssef, Maged ; Sun, Yichuang
Author_Institution :
Dept. of Electr. & Comput. Eng., Ryerson Univ., Toronto, Ont., Canada
Abstract :
This paper presents an efficient modeling and frequency domain analysis method for analyzing the effect of the clock feed-through and charge injection in switched current circuits. The effect of clock feed-through is analyzed by modeling the clock signal using two constant voltage sources that are switched periodically. The charge injection is depicted using two impulse charge sources that inject charge into both the source and drain terminals of MOS switches when the devices undergo a ON-OFF transition. In addition, both parasitic capacitances and channel resistance of MOS switches are considered. The analysis is carried out using the approach for periodically switched linear circuits. A computer program has been developed. Simulation results on example circuits are presented
Keywords :
charge injection; field effect transistor switches; frequency-domain analysis; switched current circuits; MOS switches; ON-OFF transition; channel resistance; charge injection; clock feed-through; clock signal; constant voltage sources; frequency domain analysis; impulse charge sources; parasitic capacitances; switched current circuits; Circuit simulation; Clocks; Computational modeling; Frequency domain analysis; Linear circuits; Parasitic capacitance; Signal analysis; Switches; Switching circuits; Voltage;
Conference_Titel :
Electrical and Computer Engineering, 2001. Canadian Conference on
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-6715-4
DOI :
10.1109/CCECE.2001.933747