DocumentCode
3240984
Title
Determining the Technical Complexity of Integrated Circuits
Author
Leppelt, Peter ; Barke, Erich
Author_Institution
Institute of Microelectronic Systems, EDA Group, Leibniz University Hannover, DE
fYear
2008
fDate
10-14 March 2008
Firstpage
935
Lastpage
935
Abstract
The classification and quantification of a projected design´s technical properties is essential for the prediction of success or failure of a microelectronic development project. The derived values have to mirror the design´s capacity and thus allow for an estimation of the design complexity. This chapter depicts the PRODUKTIV+ solution approach to the ascertainment of a design artifact and the determination of equations in particular.
Keywords
Algorithm design and analysis; Electronic design automation and methodology; Integrated circuit measurements; Integrated circuit technology; Microelectronics; Mirrors; Productivity; Standards development; Table lookup; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location
Munich, Germany
Print_ISBN
978-3-9810801-3-1
Electronic_ISBN
978-3-9810801-4-8
Type
conf
DOI
10.1109/DATE.2008.4484795
Filename
4484795
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