Title :
Determining the Technical Complexity of Integrated Circuits
Author :
Leppelt, Peter ; Barke, Erich
Author_Institution :
Institute of Microelectronic Systems, EDA Group, Leibniz University Hannover, DE
Abstract :
The classification and quantification of a projected design´s technical properties is essential for the prediction of success or failure of a microelectronic development project. The derived values have to mirror the design´s capacity and thus allow for an estimation of the design complexity. This chapter depicts the PRODUKTIV+ solution approach to the ascertainment of a design artifact and the determination of equations in particular.
Keywords :
Algorithm design and analysis; Electronic design automation and methodology; Integrated circuit measurements; Integrated circuit technology; Microelectronics; Mirrors; Productivity; Standards development; Table lookup; Timing;
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich, Germany
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
978-3-9810801-4-8
DOI :
10.1109/DATE.2008.4484795
