Capturing and Analyzing IC Design Productivity Metrics

You can´t improve what you can´t measure and many people won´t take the time to measure. This tutorial describes a practical, low impact method used by Synopsys Professional Services design teams to measure and analyze design flow and runtime metrics on their customer chip projects. Details about the capture methodology, database, and reporting infrastructure will be discussed. Uses for the metrics reports, as well as an overall context for design productivity improvement will be discussed. Although the details are provided within the framework of the Synopsys Design Environment, the concepts described are applicable to any structured design environment.