DocumentCode :
3241043
Title :
Fault modeling and verification of multi-million transistor VLSI circuits
Author :
Wu, David M. ; DeBrino, Mike ; Ngo, N. ; Yuan, Jiann S.
fYear :
1995
fDate :
7-9 Nov. 1995
Firstpage :
94
Abstract :
Ultra-high speed VLSI chips require high-density custom design. This paper describes a tool that extracts fault models/logic models from schematics of multi-million transistor chips. AUTOMOD is used to generate fault models for custom designed circuits. This tool is also found extremely valuable in capturing design error, such as a wrong connection of physical nets, missing pins and wrong implementations. It can also be used as a verification tool for physical and logical checking
Keywords :
Circuit faults; Circuit synthesis; Databases; Equations; FETs; Humans; Integrated circuit interconnections; Pins; Sequential circuits; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
WESCON/'95. Conference record. 'Microelectronics Communications Technology Producing Quality Products Mobile and Portable Power Emerging Technologies'
Conference_Location :
San Francisco, CA, USA
ISSN :
1095-791X
Print_ISBN :
0-7803-2636-9
Type :
conf
DOI :
10.1109/WESCON.1995.485258
Filename :
485258
Link To Document :
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