• DocumentCode
    3241043
  • Title

    Fault modeling and verification of multi-million transistor VLSI circuits

  • Author

    Wu, David M. ; DeBrino, Mike ; Ngo, N. ; Yuan, Jiann S.

  • fYear
    1995
  • fDate
    7-9 Nov. 1995
  • Firstpage
    94
  • Abstract
    Ultra-high speed VLSI chips require high-density custom design. This paper describes a tool that extracts fault models/logic models from schematics of multi-million transistor chips. AUTOMOD is used to generate fault models for custom designed circuits. This tool is also found extremely valuable in capturing design error, such as a wrong connection of physical nets, missing pins and wrong implementations. It can also be used as a verification tool for physical and logical checking
  • Keywords
    Circuit faults; Circuit synthesis; Databases; Equations; FETs; Humans; Integrated circuit interconnections; Pins; Sequential circuits; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    WESCON/'95. Conference record. 'Microelectronics Communications Technology Producing Quality Products Mobile and Portable Power Emerging Technologies'
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    1095-791X
  • Print_ISBN
    0-7803-2636-9
  • Type

    conf

  • DOI
    10.1109/WESCON.1995.485258
  • Filename
    485258