DocumentCode
3241180
Title
Reliability issues in power and ground on submicron circuits
Author
Tuan, Jeh-Fu ; Young, Tak K.
fYear
1995
fDate
7-9 Nov. 1995
Firstpage
129
Abstract
The reliability of the power supply network is becoming an important issue for IC designers as circuit sizes increase. The reliability problems in power networks are electromigration, voltage drop, and ground bounce. RailMill is an integrated environment that addresses the power network reliability problems. RailMill covers four important aspects in power network analysis: accurate extraction of power networks, accurate simulation of transistor circuits, accurate simulation of power networks and layout display of circuit and simulation results
Keywords
Circuit simulation; Data mining; Databases; Displays; Electromigration; Engines; Noise reduction; Power supplies; Resistors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
WESCON/'95. Conference record. 'Microelectronics Communications Technology Producing Quality Products Mobile and Portable Power Emerging Technologies'
Conference_Location
San Francisco, CA, USA
ISSN
1095-791X
Print_ISBN
0-7803-2636-9
Type
conf
DOI
10.1109/WESCON.1995.485265
Filename
485265
Link To Document