DocumentCode :
3241192
Title :
Performance and thermo-mechanical reliability of micro-channel coolers - a parametric study
Author :
Wunderle, B. ; Schacht, R. ; Wittler, Olaf ; Michel, B. ; Reich, H.
Author_Institution :
Fraunhofer-Inst. Zuverlassigkeit und Mikrointegration, Berlin, Germany
Volume :
2
fYear :
2004
fDate :
1-4 June 2004
Firstpage :
11
Abstract :
In the paper we present an approach based on this principle to design reliable thermal management solutions for high power applications. Thermal and thermo-mechanical reliability are measured and calculated for a flip-chip mounted die with a hot-spot using reverse-side micro-channel water cooling as cooling concept. Hereby the methodology starts by material characterisation and consistent numerical implementation. Then a numerical parametric study as to geometrical features and interface materials is carried out by coupled fluidic-thermal analysis in order to evaluate the most promising variant for optimum thermal performance within the employed technology. For experimental verification a computer-controlled closed-loop thermal-fluidic testing set-up was constructed. Good correlation was found between measured, simulated and analytical results.
Keywords :
III-V semiconductors; aluminium compounds; cooling; eutectic alloys; finite element analysis; flip-chip devices; lead alloys; microfluidics; reliability; solders; thermal analysis; thermal conductivity; thermal expansion; thermal management (packaging); thermomechanical treatment; tin alloys; AlN; SnPb; computer controlled closed loop thermal fluidic testing; coupled fluidic thermal analysis; flip-chip mounted die; hot spot; interface materials; microchannel coolers; numerical parametric analysis; optimum thermal properties; power applications; reliable thermal management solutions; reverse side microchannel water cooling; thermal reliability; thermomechanical reliability; Assembly; Computational modeling; Cooling; Integrated circuit reliability; Parametric study; Testing; Thermal conductivity; Thermal management; Thermal stresses; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2004. ITHERM '04. The Ninth Intersociety Conference on
Print_ISBN :
0-7803-8357-5
Type :
conf
DOI :
10.1109/ITHERM.2004.1318246
Filename :
1318246
Link To Document :
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