• DocumentCode
    3241366
  • Title

    High voltage 4 kV emitter switched thyristors

  • Author

    Unten, N. ; Sawant, S. ; Baliga, B.J.

  • Author_Institution
    Power SemiCond. Res. Center, North Carolina State Univ., Raleigh, NC, USA
  • fYear
    1997
  • fDate
    26-29 May 1997
  • Firstpage
    221
  • Lastpage
    224
  • Abstract
    In this paper, the characteristics of high voltage (3.5-4 kV) Emitter Switched Thyristors (ESTs) are discussed for the first time. Currently, the GTO is the most commonly used device in the 3.5-4 kV class of power devices. It has a relatively low forward voltage drop (~3 V) and high on-state current handling capability. As a bipolar device, the GTO needs a complex base drive circuit due to its low current gain and requires passive protection elements for stable operation. The IGBT is replacing the GTO in the 3.5-4 kV class because it is a voltage controlled device with simple gate control, and good current saturation capability (wide FBSOA). However, the IGBT has a high forward voltage drop (~5 V) when designed as a high voltage structure. Devices like the MCT, BRT and the EST have lower on-state voltage drops because of thyristor action. Of these devices, only the EST has current saturation capability. In this paper, we present extensive simulation results on high voltage Dual-Channel ESTs (DC-EST) in comparison to the IGBT. In addition, high voltage DC-ESTs have been successfully fabricated for the first time. These devices were found to have a superior SOA in comparison to IGBTs with comparable forward voltage drops
  • Keywords
    MOS-controlled thyristors; 4 kV; Dual-Channel EST; FBSOA; SOA; current saturation; forward voltage drop; high voltage emitter switched thyristor; on-state current handling; power device; simulation; Anodes; Cathodes; Immune system; Insulated gate bipolar transistors; Low voltage; MOSFET circuits; Medical simulation; Power semiconductor switches; Thyristors; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and IC's, 1997. ISPSD '97., 1997 IEEE International Symposium on
  • Conference_Location
    Weimar
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-3993-2
  • Type

    conf

  • DOI
    10.1109/ISPSD.1997.601477
  • Filename
    601477