DocumentCode :
3241508
Title :
EPIC: Ending Piracy of Integrated Circuits
Author :
Roy, J.A. ; Koushanfar, Farinaz ; Markov, Igor L.
Author_Institution :
Dept. of EECS, Univ. of Michigan, Ann Arbor, MI
fYear :
2008
fDate :
10-14 March 2008
Firstpage :
1069
Lastpage :
1074
Abstract :
As semiconductor manufacturing requires greater capital investments, the use of contract foundries has grown dramatically, increasing exposure to mask theft and unauthorized excess production. While only recently studied, IC piracy has now become a major challenge for the electronics and defense industries. We propose a novel comprehensive technique to end piracy of integrated circuits (EPIC). It requires that every chip be activated with an external key, which can only be generated by the holder of IP rights, and cannot be duplicated. EPIC is based on (i) automatically-generated chip IDs, (ii) a novel combinational locking algorithm, and (Hi) innovative use of public-key cryptography. Our evaluation suggests that the overhead of EPIC on circuit delay and power is negligible, and the standard flows for verification and test do not require change. In fact, major required components have already been integrated into several chips in production. We also use formal methods to evaluate combinational locking and computational attacks. A comprehensive protocol analysis concludes that EPIC is surprisingly resistant to various piracy attempts.
Keywords :
foundries; industrial property; integrated circuit design; integrated circuit manufacture; public key cryptography; random number generation; combinational locking; excess production; integrated circuit piracy; mask theft; public-key cryptography; semiconductor manufacturing; Circuit testing; Contracts; Defense industry; Foundries; Industrial electronics; Intellectual property; Intrusion detection; Investments; Production; Semiconductor device manufacture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
978-3-9810801-4-8
Type :
conf
DOI :
10.1109/DATE.2008.4484823
Filename :
4484823
Link To Document :
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