Title :
Current filaments and accompanying noises in porous silicon produced in the spark discharge
Author :
Roizin, Y.O. ; Vasilenko, V.S.
Author_Institution :
Dept. of Noncrystalline Electron. Syst., Odessa State Univ., Ukraine
Abstract :
Leakage currents in oxidized porous silicon layers were analyzed using small-size scanning mercury probes. Current filaments with properties typical for noncoherent mesoscopic systems were revealed and investigated. It was shown that intense 1/f and random telegraph noises accompany carrier transport in local leakage channels
Keywords :
1/f noise; dielectric thin films; electric breakdown; electrical conductivity transitions; high field effects; leakage currents; mesoscopic systems; porous materials; random noise; silicon compounds; sparks; SiO2; carrier transport; current filaments; intense 1/f noise; leakage currents; local leakage channels; noise; noncoherent mesoscopic systems; oxidized porous silicon layers; porous silicon; random telegraph noises; small-size scanning mercury probes; spark discharge; switching noise; Capacitance; Dielectrics; Molecular beam epitaxial growth; Oxidation; Samarium; Semiconductor films; Silicon; Sparks; Surface discharges; Testing;
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1995. ICSD'95., Proceedings of the 1995 IEEE 5th International Conference on
Conference_Location :
Leicester
Print_ISBN :
0-7803-2040-9
DOI :
10.1109/ICSD.1995.522954
