DocumentCode :
3241526
Title :
Finite element based three-dimensional forward and inverse solvers for electrical impedance tomography
Author :
Binley, Andrew ; Pinheir, Paulo ; Dickin, Fraser
Author_Institution :
Lancaster Univ., UK
fYear :
1996
fDate :
35235
Firstpage :
42522
Lastpage :
42524
Abstract :
Electrical impedance tomography (EIT) has been successfully employed to a wide range of problems including chemical process engineering, biomedical and environmental applications. In many cases information of a qualitative nature is satisfactory and to fulfil these aims techniques such as those based on backprojection methods have been used. In some cases quantitative information is needed, for example changes in true resistivity from some baseline case, rather than a `greyscale´ change. Two-dimensional (2D) methods have been used in a number of such cases although, since applications are rarely of a 2D nature, these studies cannot be classified as truly quantitative. In all cases the resultant tomogram reflects some change in electrical property, such as resistivity, but the scale of these changes cannot be quantified. Only with fully three-dimensional (3D) forward and inverse models can a true quantitative image be produced. 3D modelling also permits more accurate treatment of the true shape of the body of the region under investigation. 3D analysis, however, is clearly much more computationally demanding than a 2D alternative. In addition, increasing the parameter dimension to accommodate 3D inversion demands larger measured datasets (and hence increased data acquisition time). The authors describe here a fully 3D EIT forward and inverse modelling procedure based on finite elements techniques that has been successfully employed for a number of applications. The authors´ analysis refers specifically to resistive EIT in which the objective is to determine the 3D distribution of resistivity within the body of interest from a series of boundary measurements of resistance under different current injection configurations
Keywords :
electric impedance imaging; boundary measurements; current injection configurations; data acquisition time; electrical impedance tomography; electrical property change; finite element-based 3D solvers; forward solvers; greyscale change; inverse solvers; medical diagnostic imaging; true resistivity;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Advances in Electrical Tomography (Digest No: 1196/143), IEE Colloquium on
Conference_Location :
London
Type :
conf
DOI :
10.1049/ic:19960834
Filename :
577550
Link To Document :
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