DocumentCode
3241528
Title
Data Reduction Techniques for Intelligent Fault Diagnosis in Automotive Systems
Author
Choi, Kihoon ; Luo, Jianhui ; Pattipati, Krishna R. ; Namburu, Setu Madhavi ; Qiao, Liu ; Chigusa, Shunsuke
Author_Institution
Dept. of ECE, Univ. of Connecticut Storrs, Storrs, CT
fYear
2006
fDate
18-21 Sept. 2006
Firstpage
66
Lastpage
72
Abstract
Faults in automotive systems significantly degrade the performance and efficiency of vehicles, and often times are the major causes of vehicle break-down leading to large expenditure for repair and maintenance. An intelligent fault diagnosis system can ensure uninterrupted and reliable operation of vehicular systems, and aid in vehicle health monitoring. Due to cost constraints, the current electronic control units (ECUs) for control and diagnosis have 1-2 MB of memory and 24 -50 MHz of processor speed. Therefore, intelligent data reduction techniques and partitioning methodology are needed for effective fault diagnosis in automotive systems. In this paper, we propose a data- driven approach using a data reduction technique, coupled with a variety of classifiers, for an automotive engine system. Adaptive boosting (AdaBoost) is employed to improve the classifier performance. Our proposed techniques can be used for any vehicle systems without the need to tune the classification algorithms for a specific vehicle model. Our proposed fault diagnosis scheme results in significant reduction in data size (25.6 MBrarr12.8 KB) without loss of accuracy in classification.
Keywords
automotive electronics; data reduction; fault diagnosis; knowledge based systems; adaptive boosting; automotive engine system; automotive systems; data driven approach; data reduction techniques; intelligent fault diagnosis; vehicle breakdown; vehicle health monitoring; Adaptive systems; Automotive engineering; Costs; Degradation; Engines; Fault diagnosis; Intelligent systems; Intelligent vehicles; Maintenance; Monitoring;
fLanguage
English
Publisher
ieee
Conference_Titel
Autotestcon, 2006 IEEE
Conference_Location
Anaheim, CA
ISSN
1088-7725
Print_ISBN
1-4244-0051-1
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2006.283655
Filename
4062336
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