DocumentCode
3241614
Title
Memory-aware NoC Exploration and Design
Author
Dutt, Nikil
Author_Institution
Center for Embedded Comput. Syst., Univ. of California, Irvine, CA
fYear
2008
fDate
10-14 March 2008
Firstpage
1128
Lastpage
1129
Abstract
In the past decade, tremendous progress has been made in NoC research, spanning architectures, protocols and tools. In addition to a large number of academic and research projects, we are now seeing several commercial realizations of NoC- based chip designs. With chip capacities going well beyond the billion transistor mark, on one hand large amounts of the die are occupied by memory resources and on the other hand many complex applications being mapped to these chips are also memory-intensive. In such instances, memories dominate all the axes of traditional design constraints, including, but not limited to performance, area (cost), and power/energy. Furthermore, the move towards sub-nanometer technologies elevates another critical design consideration: process variability and thermal sensitivity, which in turn critically affect the reliability of memories as well. All of these trends make the case for a memory-aware NoC design methodology.
Keywords
integrated memory circuits; logic design; network-on-chip; NoC- based chip designs; chip capacities; memory resources; memory-aware network-on-chip exploration; network-on-chip design; process variability; sub-nanometer technologies; thermal sensitivity; Application software; Coherence; Computer architecture; Design methodology; Embedded computing; Memory architecture; Network-on-a-chip; Parallel processing; Protocols; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location
Munich
Print_ISBN
978-3-9810801-3-1
Electronic_ISBN
978-3-9810801-4-8
Type
conf
DOI
10.1109/DATE.2008.4484829
Filename
4484829
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