• DocumentCode
    3241720
  • Title

    A Bridging Fault Model Where Undetectable Faults Imply Logic Redundancy

  • Author

    Pomeranz, Irith ; Reddy, Sudhakar M.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
  • fYear
    2008
  • fDate
    10-14 March 2008
  • Firstpage
    1166
  • Lastpage
    1171
  • Abstract
    We define a robust fault model as a model where the existence of an undetectable fault implies the existence of logic redundancy, or more generally, a suboptimality in the synthesis of the circuit. The stuck-at fault model is robust, but other fault models such as certain bridging fault models are not. A robust fault model provides a mechanism to synthesize circuits in which all the target faults are detectable and 100% fault coverage is achievable. The ability to achieve 100% fault coverage, or understand why it is not achievable, is important since the requirement to achieve high test quality translates into a requirement to achieve complete fault coverage for target faults, regardless of the metrics used to measure test quality. We discuss a robust bridging fault model and its use as part of a test generation process for a non-robust bridging fault model (a non-robust bridging fault model may have to be used in order to capture the behavior of bridging defects). We also present experimental results related to the robust bridging fault model.
  • Keywords
    automatic test pattern generation; fault diagnosis; integrated circuit testing; logic testing; redundancy; bridging defects; logic redundancy; nonrobust bridging fault model; robust fault model; stuck-at fault model; test generation process; undetectable faults; Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Logic circuits; Logic testing; Redundancy; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2008. DATE '08
  • Conference_Location
    Munich
  • Print_ISBN
    978-3-9810801-3-1
  • Electronic_ISBN
    978-3-9810801-4-8
  • Type

    conf

  • DOI
    10.1109/DATE.2008.4484836
  • Filename
    4484836