DocumentCode :
3241738
Title :
Lan Topologies for Test
Author :
Drenkow, Grant
Author_Institution :
Agilent Technol., Loveland, CO
fYear :
2006
fDate :
18-21 Sept. 2006
Firstpage :
106
Lastpage :
110
Abstract :
LAN is a very flexible architecture used for computing and with the introduction of LXI will be used for test systems. This paper will show typical LAN topologies for test systems pointing out the pros and cons of different configurations. The topology selected may have an impact on the performance of the test system. The paper wiII also delve into the need for LAN security and give practical advice on setting up test networks that protect the system from intruders. It will pay particular attention to LXI class B (using IEEE 1588) networks with practical advice on the position of instruments in the network and the use of boundary clocks for accurate timing.
Keywords :
automatic test equipment; local area networks; peripheral interfaces; LAN extensions for instruments; LAN security; LAN topologies; boundary clocks; flexible architecture; test systems; Backplanes; Computer architecture; Computer interfaces; Computer networks; Ethernet networks; Instruments; Local area networks; Network topology; Switches; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
1-4244-0051-1
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2006.283665
Filename :
4062346
Link To Document :
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