• DocumentCode
    3241790
  • Title

    Hiding Cache Miss Penalty Using Priority-based Execution for Embedded Processors

  • Author

    Park, Sanghyun ; Shrivastava, Aviral ; Paek, Yunheung

  • Author_Institution
    SO&R Res. Group, Seoul Nat. Univ., Seoul
  • fYear
    2008
  • fDate
    10-14 March 2008
  • Firstpage
    1190
  • Lastpage
    1195
  • Abstract
    The contribution of memory latency to execution time continues to increase, and latency hiding mechanisms become ever more important for efficient processor design. While high-end processors can use elaborate techniques like multiple issue, out-of-order execution, speculative execution, value prediction etc. to tolerate high memory latencies, they are often not viable solutions for embedded processors, due to significant area, power and chip complexity overheads. This paper proposes a hardware-software cooperative approach, called priority-based execution to hide cache miss penalty for embedded processors. The compiler classifies the instructions into low-priority and high-priority instructions. The processor executes the high-priority instructions, but delays the execution of low priority instructions. They are executed on a cache miss to hide the cache miss penalty. We empirically evaluate our proposal on the Intel XScale compiler and microarchitecture. Experimental results on benchmarks from Multimedia, MediaBench, MiBench, and SPEC2000 demonstrate an average 17% performance improvements, hiding 75% cache miss penalty.
  • Keywords
    embedded systems; hardware-software codesign; program compilers; storage management; Intel XScale compiler; cache miss penalty hiding; embedded processor design; hardware-software cooperative approach; high priority instruction; instruction classification; latency hiding mechanism; low priority instruction; memory latency; priority-based execution; Costs; Delay; Hardware; Microarchitecture; Out of order; Performance analysis; Pipelines; Process design; Proposals; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2008. DATE '08
  • Conference_Location
    Munich
  • Print_ISBN
    978-3-9810801-3-1
  • Electronic_ISBN
    978-3-9810801-4-8
  • Type

    conf

  • DOI
    10.1109/DATE.2008.4484840
  • Filename
    4484840