• DocumentCode
    3241799
  • Title

    Reconstruction Strategy for Multi-Class SVM Based on Posterior Probability

  • Author

    Wu, Deihui

  • Author_Institution
    Key Lab. of Numerical Control of Jiangxi Province, Jiujiang Univ., Jiujiang
  • fYear
    2008
  • fDate
    22-24 Oct. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    After analysis and comparison of the problems of the existing one-versus-one (OVO) and one-versus-rest (OVR) decomposition methods of multi-class support vector machine (SVM), the novel strategy based on posterior probability is presented to reconstruct a multi-class classifier from binary SVM-based classifiers. The new reconstruction strategy can increase recognition accuracy and resolve the unclassifiable region problems in the conventional ones. Firstly, the geometric distance of test sample to the optimal classification hyperplane is used as the criterion of estimating the class probabilities to decrease the incomparability existing in different binary SVM-based classifiers. Then based on the Bayesian posterior probability theory, the combination strategy of the probability output among these binary SVM-based classifiers in OVO decomposition is given and the different prior probabilities of them are considered. Lastly, the prior probabilities are evaluated by OVR decomposition. In order to verify the effectiveness of this strategy, experiments have been made on UCI database; the experiment results show that the reconstruction strategy presented is effective over conventional ones.
  • Keywords
    Bayes methods; pattern classification; probability; support vector machines; Bayesian posterior probability theory; binary SVM-based classifier; multiclass SVM; multiclass classifier; optimal classification hyperplane; reconstruction strategy; support vector machine; Bayesian methods; Computer numerical control; Databases; Electronic mail; Laboratories; Region 1; Support vector machine classification; Support vector machines; Testing; Virtual colonoscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2008. CCPR '08. Chinese Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2316-3
  • Type

    conf

  • DOI
    10.1109/CCPR.2008.21
  • Filename
    4662974