DocumentCode :
3241851
Title :
LXI Clears the Way to Smarter Instruments
Author :
Franklin, Pau F.
Author_Institution :
Keithley Instrum. Inc., Cleveland, OH
fYear :
2006
fDate :
18-21 Sept. 2006
Firstpage :
136
Lastpage :
140
Abstract :
The trend toward more intelligent instruments has become increasingly evident as vendors of test and measurement equipment take advantage of increased processing power to expand the features and functions their products provide. These include advanced data analysis and reduction, more sophisticated sequencing and control, and built-in functions targeted at specific T&M applications. This paper details how the capabilities included in the LXI (LAN extensions for instrumentation) standard enhance and accelerate the trend toward smarter instruments. It examines how the new generation of LXI smart instruments will lower the total cost of test while improving performance, increasing flexibility, and enhancing ease of use.
Keywords :
data analysis; local area networks; peripheral interfaces; LAN extensions; LXI; advanced data analysis; intelligent instruments; measurement equipment; Acceleration; Costs; Data analysis; Instruments; Local area networks; Maintenance; Manufacturing; Power measurement; System testing; Web pages;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
1-4244-0051-1
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2006.283610
Filename :
4062351
Link To Document :
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