• DocumentCode
    32420
  • Title

    Defect Characterization With Eddy Current Testing Using Nonlinear-Regression Feature Extraction and Artificial Neural Networks

  • Author

    Rosado, Luis S. ; Janeiro, Fernando M. ; Ramos, Pedro M. ; Piedade, Moises

  • Author_Institution
    Inst. de Telecomun., UTL, Lisbon, Portugal
  • Volume
    62
  • Issue
    5
  • fYear
    2013
  • fDate
    May-13
  • Firstpage
    1207
  • Lastpage
    1214
  • Abstract
    The estimation of the parameters of defects from eddy current nondestructive testing data is an important tool to evaluate the structural integrity of critical metallic parts. In recent years, several works have reported the use of artificial neural networks (ANNs) to deal with the complex relation between the testing data and the defect properties. To extract relevant features used by the ANN, principal component analysis, wavelet decomposition, and the discrete Fourier transform have been proposed. In this paper, a method to estimate dimensional parameters from eddy current testing data is reported. Feature extraction is based on the modeling of the testing data by a template of additive Gaussian functions and nonlinear regressions to estimate their parameters. An ANN was trained using features extracted from a synthetic data set obtained with finite-element modeling of the eddy current probe. The proposed method was applied to both simulated and measured data, providing good estimates.
  • Keywords
    discrete Fourier transforms; eddy current testing; feature extraction; finite element analysis; neural nets; nonlinear equations; ANN; additive Gaussian functions; artificial neural networks; critical metallic parts; defect characterization; discrete Fourier transform; eddy current probe; eddy current testing; finite-element modeling; nonlinear regressions; nonlinear-regression feature extraction; principal component analysis; structural integrity; Artificial neural networks; Coils; Current measurement; Eddy currents; Feature extraction; Neurons; Probes; Artificial neural networks (ANNs); defect parameter estimation; eddy current testing (ECT); feature extraction; nonlinear regression;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2012.2236729
  • Filename
    6422389