• DocumentCode
    3242335
  • Title

    Dependable Embedded Systems Special Day Panel: Issues and Challenges in Dependable Embedded Systems

  • Author

    Suri, Neeraj ; Fetzer, Christof ; Abraham, Jacob ; Poledna, Stefan ; Mendelson, Avi ; Mitra, Subhasish

  • Author_Institution
    TU Darmstadt, Germany
  • fYear
    2008
  • fDate
    10-14 March 2008
  • Firstpage
    1394
  • Lastpage
    1395
  • Abstract
    The paper presents a panel discussion on the issues and challenges in dependable embedded system from both the academic and industrial perspectives. The panelists are Jacob Abraham from the University of Texas at Austin-USA, Stefan Poledna from TTTech-Austria, Avi Mendelson from Intel-Israel, and Subhasish Mitra from Stanford University-USA.
  • Keywords
    embedded systems; logic design; reliability; academic perspective; dependable embedded systems; industrial perspective; panel discussion; Circuit testing; Embedded system; Fault tolerance; Hardware; Integrated circuit technology; Integrated circuit testing; Jacobian matrices; Paper technology; Robustness; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2008. DATE '08
  • Conference_Location
    Munich
  • Print_ISBN
    978-3-9810801-3-1
  • Electronic_ISBN
    978-3-9810801-4-8
  • Type

    conf

  • DOI
    10.1109/DATE.2008.4484868
  • Filename
    4484868
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3242335