Title :
In-Situ, Real-Time Detector for Faults in Solder Joint Networks Belonging to Operational, Fully Programmed Field Programmabmle Gate Arrays (FPGAS)
Author :
Hofmeister, James P. ; Lall, Pradeep ; Graves, Russell
Author_Institution :
Ridgetop Group, Inc., Tucson, AZ
Abstract :
In this paper we introduce an in-situ solder-joint built-in self-test (SJ BIST) for detecting high-resistance faults in operational, fully-programmed field programmable gate arrays (FPGAs). The approach is simple to implement, offers a method to detect high- resistance faults that result from damaged solder-joints, and uses a maximum of one small capacitor externally-connected to each selected test pin or each group of two test pins.
Keywords :
built-in self test; fault diagnosis; field programmable gate arrays; solders; faults real-time detector; high-resistance faults; programmed field programmable gate arrays; solder joint networks faults; solder-joint built-in self-test; Built-in self-test; Detectors; Electronic equipment testing; Fault detection; Field programmable gate arrays; Packaging; Sensor arrays; Soldering; Thermal stresses; Thermomechanical processes;
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
1-4244-0051-1
Electronic_ISBN :
1088-7725
DOI :
10.1109/AUTEST.2006.283644
