DocumentCode
3242425
Title
In-Situ, Real-Time Detector for Faults in Solder Joint Networks Belonging to Operational, Fully Programmed Field Programmabmle Gate Arrays (FPGAS)
Author
Hofmeister, James P. ; Lall, Pradeep ; Graves, Russell
Author_Institution
Ridgetop Group, Inc., Tucson, AZ
fYear
2006
fDate
18-21 Sept. 2006
Firstpage
237
Lastpage
243
Abstract
In this paper we introduce an in-situ solder-joint built-in self-test (SJ BIST) for detecting high-resistance faults in operational, fully-programmed field programmable gate arrays (FPGAs). The approach is simple to implement, offers a method to detect high- resistance faults that result from damaged solder-joints, and uses a maximum of one small capacitor externally-connected to each selected test pin or each group of two test pins.
Keywords
built-in self test; fault diagnosis; field programmable gate arrays; solders; faults real-time detector; high-resistance faults; programmed field programmable gate arrays; solder joint networks faults; solder-joint built-in self-test; Built-in self-test; Detectors; Electronic equipment testing; Fault detection; Field programmable gate arrays; Packaging; Sensor arrays; Soldering; Thermal stresses; Thermomechanical processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Autotestcon, 2006 IEEE
Conference_Location
Anaheim, CA
ISSN
1088-7725
Print_ISBN
1-4244-0051-1
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2006.283644
Filename
4062375
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