DocumentCode :
3242436
Title :
Memory Organization with Multi-Pattern Parallel Accesses
Author :
Vitkovski, A. ; Kuzmanov, Arseni Vitkovski Georgi ; Gaydadjiev, Georgi
Author_Institution :
ARCES, Univ. of Bologna, Bologna
fYear :
2008
fDate :
10-14 March 2008
Firstpage :
1420
Lastpage :
1425
Abstract :
We propose an interleaved memory organization supporting multi-pattern parallel accesses in two-dimensional (2D) addressing space. Our proposal targets computing systems with high memory bandwidth demands such as vector processors, multimedia accelerators, etc. We substantially extend prior research on interleaved memory organizations introducing 2D-strided accesses along with additional parameters, which define a large variety of 2D data patterns. The proposed scheme guarantees minimum memory latency and efficient bandwidth utilization for arbitrary configuration parameters of the data pattern. We provide mathematical descriptions and proofs of correctness for the proposed addressing schemes. The design complexity and the critical paths are evaluated using technology independent resource counts and confirm the scalability of the proposal. Hardware synthesis results for 90 nm CMOS technology suggest that throughputs in the range between 44 and 1182 Gbit/s can be obtained at the cost of 26-212 Kgates for configurations of 2 x 2 32-bit up to 8x8 64-bit memory modules.
Keywords :
CMOS integrated circuits; integrated circuit design; integrated memory circuits; interleaved storage; parallel memories; 2D data patterns; 2D-strided accesses; CMOS technology; bandwidth utilization; bit rate 44 Gbit/s to 1182 Gbit/s; design complexity; hardware synthesis; interleaved memory organization; memory bandwidth; memory latency; memory modules; multipattern parallel accesses; two-dimensional addressing space; Bandwidth; CMOS technology; Delay; Hardware; Multimedia computing; Multimedia systems; Proposals; Scalability; Throughput; Vector processors; Conflict-free access; high bandwidth; multi-pattern access; parallel memories;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
978-3-9810801-4-8
Type :
conf
DOI :
10.1109/DATE.2008.4484873
Filename :
4484873
Link To Document :
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