DocumentCode :
3242452
Title :
On chaotic aspects of trees
Author :
Fujimori, S. ; Endoh, T. ; Mitsuboshi, K. ; Ishiwata, K. ; Akasaka, M. ; Hiruta, S.
Author_Institution :
Dept. of Electr. Eng., Tokai Univ., Kanagawa, Japan
fYear :
1995
fDate :
10-13 Jul 1995
Firstpage :
185
Lastpage :
189
Abstract :
All things degrade and breakdown, and we live in degraded circumstances or we use such things, for example, as electrical insulating materials in electrical engineering etc. Thus it is very important to study and estimate these degradation processes. Almost all cases of solid degradation processes, which are a kind of branching process, have been very difficult to analyze, due to their nonlinearity and complexity, until recent developments of computer and analysing methods such as fractal wavelet, chaotic concepts etc. were proposed. Under such conditions, fractal properties of tree phenomena which are a kind of degradation process of solid insulating materials have been studied and various characteristics obtained. As for the tree phenomena which is a typical branching process, we report some chaotic aspects based on Takens´s reconstruction theorem. Thus, the trajectories reconstructed from a series of discharge current pulses accompanied with tree developments are discussed. In this work a different tree pattern from the previous are discussed and further study is based on wavelet analysis, thus, the trajectory of time dependent wavelet coefficients was reconstructed as well as current pulse data
Keywords :
chaos; electric breakdown; insulating materials; trees (electrical); branching process; breakdown; chaotic aspects; complexity; degraded circumstances; discharge current pulses; electrical insulating materials; fractal wavelet; nonlinearity; reconstruction theorem; time dependent wavelet coefficients; tree phenomena; trees; Chaos; Degradation; Dielectrics and electrical insulation; Electric breakdown; Electrical engineering; Fractals; Pattern analysis; Solids; Trees - insulation; Wavelet analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1995. ICSD'95., Proceedings of the 1995 IEEE 5th International Conference on
Conference_Location :
Leicester
Print_ISBN :
0-7803-2040-9
Type :
conf
DOI :
10.1109/ICSD.1995.522974
Filename :
522974
Link To Document :
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