DocumentCode :
3242706
Title :
Performance Based Test - Example of Universal RF Tester with Built in Automated Diagnostics and Automated Probing for Manufacturing and Depot Level Testing
Author :
Lowenstein, Duane
Author_Institution :
Agilent Technol., Andover, MA
fYear :
2006
fDate :
18-21 Sept. 2006
Firstpage :
306
Lastpage :
310
Abstract :
This paper explores the strategy and processes used to simplify the specification, data and implementation of combining functional tests for multiple lowest replaceable units (LRUs) on a single tester at a cost and complexity the same as that of a similar single unit product tester. It shows that developing test strategies during the preliminary and detailed design reviews, companies can address many aspects of performance based logistics in terms of test processes that specifically can address cost, complexity and support throughout the products life cycle.
Keywords :
electronics industry; product life cycle management; test equipment; automated diagnostics; automated probing; depot level testing; lowest replaceable units; performance based test; products life cycle; universal RF tester; Automatic testing; Cost function; Electronic equipment testing; Life testing; Logistics; Manufacturing automation; Manufacturing processes; Pulp manufacturing; Radio frequency; Software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
1-4244-0051-1
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2006.283675
Filename :
4062388
Link To Document :
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