• DocumentCode
    3242747
  • Title

    Iris Recognition Based on the Barycenter Distance Vector of New Non-Separable Wavelet

  • Author

    Huang, Jing ; You, Xinge ; Tang, Yuan Yan

  • Author_Institution
    Dept. of Electron. & Inf. Eng., Huazhong Univ. of Sci. & Technol., Wuhan
  • fYear
    2008
  • fDate
    22-24 Oct. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper makes an attempt to analyze the local feature structure of iris texture information based on the barycenter distance of new non-separable wavelet. When preprocessed, the annular iris is normalized into a rectangular block. Several non-separable wavelet filters are used to capture the iris texture. In every filtered subband coefficients, we extract a certain number of largest positive coefficients and smallest negative coefficients that can represent the local texture most effectively in each subband. The barycenter of these positive coefficients in each subband is called positive barycenter, and the barycenter of negative coefficients is called negative barycenter. Then, the vector from negative barycenter to positive one is called barycenter distance vector, which is regarded as the iris feature vector. Iris feature matching is based on the similarity of the vectors. Experimental results on public databases show that the performance of the proposed method is as good as Daugman´s method, and our method is more robust than Daugman´s method to rotation transform in small scale.
  • Keywords
    biometrics (access control); eye; feature extraction; image matching; image representation; image texture; object recognition; wavelet transforms; annular iris normalization; barycenter distance vector; iris feature matching; iris feature vector; iris recognition; iris texture information; local feature structure analysis; local texture representation; nonseparable wavelet filters; rectangular block; subband coefficient; vector similarity; Biometrics; Computer science; Data mining; Data security; Filters; Information analysis; Iris recognition; Robustness; Spatial databases; Wavelet analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2008. CCPR '08. Chinese Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2316-3
  • Type

    conf

  • DOI
    10.1109/CCPR.2008.67
  • Filename
    4663020