DocumentCode :
3242811
Title :
Analysis and Optimization of the Recessed Probe Launch for High Frequency Measurements of PCB Interconnects
Author :
Rimolo-Donadio, Renato ; Schuster, Christian ; Gu, Xiaoxiong ; Kwark, Young H. ; Ritter, Mark B.
Author_Institution :
Inst. fur Theor. Elektrotechnik, Tech. Univ. Hamburg-Harburg, Hamburg
fYear :
2008
fDate :
10-14 March 2008
Firstpage :
252
Lastpage :
255
Abstract :
Measurements of internal printed circuit board (PCB) structures such as striplines and vias face the problem of launching clean test signals into the device under test (DUT). Traditionally, coaxial connectors or surface probing with high frequency microprobes are used to provide interfaces to test equipment. Both approaches have to be carefully optimized in order to give adequate results for the multi-GHz range. This paper discusses a different access technique, the recessed probe launch (RPL), which was previously used by the authors for measurements up to 40 GHz. Full-wave 3D electromagnetic modeling is applied to analyze the parasitics of the proposed launch technique and to find strategies for its optimization. Comparison to measurement shows that the models are able to predict the major physics of the launch but several details still need to be explored, e.g. accurate modeling of the microprobes, material parameters, and network analyzer calibration.
Keywords :
frequency measurement; network analysers; optimisation; printed circuits; DUT; PCB interconnects; RPL; coaxial connectors; device under test; full-wave 3D electromagnetic modeling; high frequency measurements; internal printed circuit board; network analyzer calibration; optimization; recessed probe launch; Circuit testing; Coaxial components; Connectors; Electromagnetic measurements; Frequency measurement; Integrated circuit interconnections; Predictive models; Printed circuits; Probes; Stripline;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
978-3-9810801-4-8
Type :
conf
DOI :
10.1109/DATE.2008.4484891
Filename :
4484891
Link To Document :
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