Title :
A novel technique for noise-tolerance in dynamic circuits
Author :
Goel, Sumeer ; Darwish, Tarek ; Bayoumi, Magdy
Author_Institution :
Center for Adv. Comput. Studies, Louisiana Univ., Lafayette, LA, USA
Abstract :
Noise issues in deep submicron CMOS VLSI circuits have an importance comparable to area, delay and power consumption issues due to aggressive scaling trends in devices and interconnections. An attempt has been made to address this problem in this paper. A new technique to make dynamic CMOS circuits noise tolerant has been proposed by the authors. Simulation results for a dynamic-CMOS NAND gate and a dynamic-CMOS 1-bit full-adder circuit show that the proposed technique has an improvement in ANTE of 6.0X over conventional dynamic logic. The proposed technique, in comparison with the twin transistor technique, proves to improve ANTE by 2.8X. There is a large power dissipation incurred during the evaluation period for certain input combinations.
Keywords :
CMOS logic circuits; VLSI; adders; integrated circuit noise; logic design; logic gates; deep submicron CMOS VLSI circuits; dynamic CMOS NAND gate; dynamic CMOS adder circuit; dynamic CMOS circuits; limiter transistor technique; noise tolerant technique; noise-immunity; static power consumption; Circuit noise; Computer Society; Very large scale integration;
Conference_Titel :
VLSI, 2003. Proceedings. IEEE Computer Society Annual Symposium on
Print_ISBN :
0-7695-1904-0
DOI :
10.1109/ISVLSI.2003.1183465