DocumentCode :
3242853
Title :
Automatic centroid detection for Shack-Hartmann Wavefront sensor
Author :
Yin, Xiaoming ; Li, Xiang ; Zhao, Liping ; Fang, Zhongping
Author_Institution :
Singapore Inst. of Manuf. Technol., Singapore, Singapore
fYear :
2009
fDate :
14-17 July 2009
Firstpage :
1986
Lastpage :
1991
Abstract :
Shark-Hartmann Wavefront sensor splits the incident wavefront into many subsections and transfers the distorted wavefront detection into the centroid measurement. The accuracy of the centroid measurement determines the accuracy of the Shack-Hartmann Wavefront Sensor. A lot of methods have been presented to improve the accuracy of the wavefront centroid measurement. However, most of these methods are discussed from the point of view of optics, and based on the assumption that the spot intensity of the SHWS has a Gaussian distribution, which is not applicable to the digital SHWS. In this paper, we have presented a new centroid measurement algorithm based on adaptive thresholding and dynamic windowing method by utilizing image processing techniques for practical application of the digital Shack-Hartmann Wavefront Sensor in surface profile measurement. The method can detect the centroid of the spot accurately and robustly by eliminating the influences of various noises such as diffraction of the digital SHWS, uneven and instability of the light source as well as deviation between the centroid of the spot and the center of the detection area. The experimental results demonstrate that the algorithm has better accuracy, repeatability and stability compared with other commonly used centroid methods such statistic averaging, thresholding and windowing algorithms.
Keywords :
Gaussian distribution; image processing; wavefront sensors; Gaussian distribution; Shack-Hartmann wavefront sensor; adaptive thresholding; automatic centroid detection; centroid measurement; centroid methods; dynamic windowing method; image processing techniques; incident wavefront; light source; spot intensity; statistic averaging; surface profile measurement; wavefront detection; Adaptive optics; Distortion measurement; Gaussian distribution; Image processing; Image sensors; Noise robustness; Optical distortion; Optical sensors; Optical surface waves; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Intelligent Mechatronics, 2009. AIM 2009. IEEE/ASME International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2852-6
Type :
conf
DOI :
10.1109/AIM.2009.5229758
Filename :
5229758
Link To Document :
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