Title :
PWM-based test stimuli generation for BIST of high resolution ΣΔ ADCs
Author :
De Venuto, Daniela ; Reyneri, Leonardo
Author_Institution :
Politec. di Bari, Bari
Abstract :
A fully digital test stimuli generation and on-chip specifications evaluation for cheap, fast, though accurate testing of high resolution ΣΔ ADCs are here presented. Simulations and measurements showed a discrimination threshold on specification parameters up to -90 dBc. The proposed method helps reduce the cost of ADC production test, to extend test coverage and to enable built-in self-test and test-based self-calibration.
Keywords :
σ-δ modulation; built-in self test; pulse width modulation; ΣΔ ADCs; σ-δ modulatiors; BIST; PWM-based test stimuli generation; analog-digital converters; built-in self test; digital test stimuli generation; pulse width modulation; self-calibration; Automatic testing; Built-in self-test; Circuit testing; Clocks; Pulse generation; Pulse width modulation; Signal generators; Signal processing; Signal resolution; Space vector pulse width modulation;
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE '08
Conference_Location :
Munich
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
978-3-9810801-4-8
DOI :
10.1109/DATE.2008.4484899
