• DocumentCode
    3243006
  • Title

    Hardware Agnostic Approach to TPS Life Cycle Sustainment

  • Author

    Donnell, Steven J O ; Krayewsky, Michael F.

  • Author_Institution
    Lockheed Martin, Orlando, FL
  • fYear
    2006
  • fDate
    18-21 Sept. 2006
  • Firstpage
    371
  • Lastpage
    375
  • Abstract
    Lockheed Martin simulation, training and support (LM-STS) has developed an innovative "hardware agnostic" technical approach to protect the TPS investment from hardware obsolescence. LM-STS developed a set of instrument translators that determine the intent of the legacy TPS call at runtime. Equivalent calls to the LM-STARreg system software are then made to achieve the desired functionality utilizing the new replacement hardware instead of the obsolete legacy hardware. Lockheed Martin missiles and fire controls (LM-MFC) also had requirements to have one set of TPS source code and one set of built TPS that were capable of running legacy and new hardware configurations. Having a controlled set of TPS for the legacy configuration and yet another for the new configuration was deemed too costly and risky. LM-MFC desired to move the TPS from a legacy system to the new system by using intelligent underlying system software capable of performing the appropriate action depending on the hardware configuration. This paper will describe our technical approach to supporting legacy and new hardware configurations via instrument translators without impacting the TPS and present our experience in rehosting LM-MFC TPS utilizing our LM-STARreg system software architecture.
  • Keywords
    automatic testing; missile control; LM-STAR system software; Lockheed Martin Simulation; hardware agnostic approach; hardware obsolescence; instrument translators; legacy system support; life cycle sustainment; missiles control; test program set; Computer architecture; Fires; Hardware; Instruments; Intelligent systems; Investments; Missiles; Protection; Runtime; System software;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2006 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    1-4244-0051-1
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2006.283689
  • Filename
    4062402