DocumentCode

3243027

Title

Converting Legacy TPSs using Test Description Markup Language3826

Author

Woodward, Vernon L. ; Martin, Lockheed S.

fYear

2006

fDate

Sept. 2006

Firstpage

376

Lastpage

376

Keywords

Markup languages; Publishing; Sociotechnical systems; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Autotestcon, 2006 IEEE

Conference_Location

Anaheim, CA, USA

ISSN

1088-7725

Print_ISBN

1-4244-0051-1

Electronic_ISBN

1088-7725

Type

conf

DOI

10.1109/AUTEST.2006.283690

Filename

4062403