DocumentCode :
3243530
Title :
Fault Tree Reuse Across Multiple Reasoning Paradigms
Author :
Harris, Matthew W. ; Helton, Ashley ; Bodkin, Michael ; Ralph, Joseph
Author_Institution :
Lockheed Martin STS, Orlando, FL
fYear :
2006
fDate :
18-21 Sept. 2006
Firstpage :
496
Lastpage :
500
Abstract :
The development of a diagnostic model can be a very time-consuming and manually intensive process. One must first analyze the Test Program Set (TPS) to determine the fault tree and then integrate with that any additional knowledge that can be obtained from external data sources (such as test results, maintenance actions from the various maintenance levels, run-time failure information, etc.). The diagnostic models defined in the IEEE Std. 1232-2002 (AI-ESTATE) each define a different method that can be used for a diagnostic reasoner. It has been determined that each of these models utilize the information found in the basic TPS fault tree. As the fault tree represents hard won engineering knowledge that is expensive to reproduce, it is desirable to share the fault tree representations across multiple reasoner models. This paper will layout how each model type in the AI-ESTATE standard utilizes the fault tree to perform diagnostics and how, through the use of the XML representation of the AI-ESTATE fault tree model, that basic fault tree can be shared between reasoner models. It would also be desirable to find a way to gain that fault tree knowledge without having to manually reproduce it. As such, this paper will also describe how that information can at least be semi-automatically extracted from TPS design artifacts.
Keywords :
IEEE standards; XML; automatic test software; fault trees; inference mechanisms; AI-ESTATE standard; IEEE Std. 1232-2002; XML representation; diagnostic models; diagnostic reasoner; fault tree reuse; multiple reasoning paradigms; test program set; Failure analysis; Fault trees; Information analysis; Knowledge engineering; Lakes; Ontologies; Runtime; Sociotechnical systems; Testing; XML;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
1-4244-0051-1
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2006.283713
Filename :
4062426
Link To Document :
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