DocumentCode
3243698
Title
Solvation structure of impurity molecules in supercritical fluids studied by photoconductivity measurement and X-ray absorption fine structure (XAFS) spectroscopy
Author
Nakagawa, Kazumichi ; Murata, Takatoshi
Author_Institution
Fac. of Human Dev., Kobe Univ., Japan
fYear
1999
fDate
1999
Firstpage
108
Lastpage
109
Abstract
Solvation structure of anthracene molecules and bromonaphthalene molecules doped in supercritical xenon fluids was studied on the basis of photoconductivity spectroscopy and X-ray absorption spectroscopy. It was concluded that values of ionization potential derived from photoconductivity measurements were sensitive for the association of xenon atoms onto the benzene rings of the anthracene molecule. Results from the X-ray absorption near-edge structure (XANES) spectra of bromonaphthalene in supercritical xenon and the local association of xenon atoms surrounding the Br atom were detected with high sensitivity
Keywords
EXAFS; XANES; dielectric liquids; photoconductivity; solvation; XAFS; XANES; anthracene molecule; bromonaphthalene molecule; impurity molecules; ionization potential; photoconductivity; solvation structure; supercritical fluids; xenon fluid; Atomic measurements; Dielectrics; Electromagnetic wave absorption; Electrons; Impurities; Ionization; Photoconductivity; Spectroscopy; Synchrotron radiation; Xenon;
fLanguage
English
Publisher
ieee
Conference_Titel
Dielectric Liquids, 1999. (ICDL '99) Proceedings of the 1999 IEEE 13th International Conference on
Conference_Location
Nara
Print_ISBN
0-7803-4759-5
Type
conf
DOI
10.1109/ICDL.1999.798881
Filename
798881
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