• DocumentCode
    3243698
  • Title

    Solvation structure of impurity molecules in supercritical fluids studied by photoconductivity measurement and X-ray absorption fine structure (XAFS) spectroscopy

  • Author

    Nakagawa, Kazumichi ; Murata, Takatoshi

  • Author_Institution
    Fac. of Human Dev., Kobe Univ., Japan
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    108
  • Lastpage
    109
  • Abstract
    Solvation structure of anthracene molecules and bromonaphthalene molecules doped in supercritical xenon fluids was studied on the basis of photoconductivity spectroscopy and X-ray absorption spectroscopy. It was concluded that values of ionization potential derived from photoconductivity measurements were sensitive for the association of xenon atoms onto the benzene rings of the anthracene molecule. Results from the X-ray absorption near-edge structure (XANES) spectra of bromonaphthalene in supercritical xenon and the local association of xenon atoms surrounding the Br atom were detected with high sensitivity
  • Keywords
    EXAFS; XANES; dielectric liquids; photoconductivity; solvation; XAFS; XANES; anthracene molecule; bromonaphthalene molecule; impurity molecules; ionization potential; photoconductivity; solvation structure; supercritical fluids; xenon fluid; Atomic measurements; Dielectrics; Electromagnetic wave absorption; Electrons; Impurities; Ionization; Photoconductivity; Spectroscopy; Synchrotron radiation; Xenon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dielectric Liquids, 1999. (ICDL '99) Proceedings of the 1999 IEEE 13th International Conference on
  • Conference_Location
    Nara
  • Print_ISBN
    0-7803-4759-5
  • Type

    conf

  • DOI
    10.1109/ICDL.1999.798881
  • Filename
    798881