DocumentCode :
3243742
Title :
Taking Advantage of PXI Interoperability and Compatibility for Test System Longevity
Author :
Peng, Faya
Author_Institution :
Nat. Instrum., Austin, TX
fYear :
2006
fDate :
18-21 Sept. 2006
Firstpage :
552
Lastpage :
556
Abstract :
This paper discusses how the PXI platform extends system longevity by providing interoperability with other buses as well compatibility with the release of additional specifications. As longevity is often a major system concern, PXI provides the ability to easily connect to other buses in a hybrid system to maximize use of equipment. In addition, PXI ensures compatibility with new PXI specifications that are released to ensure system longevity.
Keywords :
automatic test equipment; field buses; PXI interoperability; PXI specifications; test system longevity; Costs; Ethernet networks; Hardware; Instruments; Life testing; Local area networks; Software standards; System testing; Topology; Universal Serial Bus;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
1-4244-0051-1
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2006.283725
Filename :
4062438
Link To Document :
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