DocumentCode
3243742
Title
Taking Advantage of PXI Interoperability and Compatibility for Test System Longevity
Author
Peng, Faya
Author_Institution
Nat. Instrum., Austin, TX
fYear
2006
fDate
18-21 Sept. 2006
Firstpage
552
Lastpage
556
Abstract
This paper discusses how the PXI platform extends system longevity by providing interoperability with other buses as well compatibility with the release of additional specifications. As longevity is often a major system concern, PXI provides the ability to easily connect to other buses in a hybrid system to maximize use of equipment. In addition, PXI ensures compatibility with new PXI specifications that are released to ensure system longevity.
Keywords
automatic test equipment; field buses; PXI interoperability; PXI specifications; test system longevity; Costs; Ethernet networks; Hardware; Instruments; Life testing; Local area networks; Software standards; System testing; Topology; Universal Serial Bus;
fLanguage
English
Publisher
ieee
Conference_Titel
Autotestcon, 2006 IEEE
Conference_Location
Anaheim, CA
ISSN
1088-7725
Print_ISBN
1-4244-0051-1
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2006.283725
Filename
4062438
Link To Document