DocumentCode :
3243878
Title :
VXI Standard Revision to Meet Today´s Technology Requirements
Author :
Stora, Michael ; Davis, Bob
Author_Institution :
IEEE l&M Soc., Boonton, NJ
fYear :
2006
fDate :
18-21 Sept. 2006
Firstpage :
578
Lastpage :
583
Abstract :
This standard describes the electrical and mechanical specifications of the IEEE-1155 VME extensions for Instrumentation (VXI) Standard that supports an integrated legacy parallel bus and serial bus architecture adopted from VME International Trade Association (VITA) Standard 41.3 [1], and LAN extensions for Instrumentation (LXI) Consortium [2]. It also addresses the definition of: (a) a C-size pluggable virtual power module; (b) the direct coupling option of the instrument module to the IEEE-P1505 receiver fixture interface (RFI) [3]; (c) enhanced cooling structure; (d) advanced VME controller/switch fabric modules; (e) VME64 connector compliance implementation; (f) improved noise and ripple isolation; (g) cooling air flow measurement; (h) IEEE-1149.1/4 test bus boundary scan/mixed signal [4]; and (i) LXI protocol/control line implementation. The specification also details: instrument module footprints, connector mechanics and electrical I/O between the backplane and instrument module, cooling/ EMI requirements; VXI mainframe mechanical structure, cooling and environmental requirements; and the VXI backplane mechanical and electrical requirements.
Keywords :
input-output programs; local area networks; system buses; EMI requirements; IEEE-1155 VME extensions for Instrumentation specifications; IEEE-P1505 receiver fixture interface; LAN extensions for Instrumentation; VME International Trade Association Standard; VXI mainframe mechanical structure; VXI standard revision; advanced VME controller-switch fabric modules; cooling air flow measurement; noise-ripple isolation; Backplanes; Connectors; Cooling; Fixtures; Instruments; International trade; Local area networks; Multichip modules; Switches; Temperature control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
1-4244-0051-1
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2006.283731
Filename :
4062444
Link To Document :
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