DocumentCode
3243909
Title
Determine the Masking Fault Sets in Complex Systems
Author
Xu, Bin ; Feng, Keming
Author_Institution
Beijing Inst. of Radio Metrol. & Meas., Beijing
fYear
2006
fDate
18-21 Sept. 2006
Firstpage
585
Lastpage
590
Abstract
Fault isolation could be categorized into two classes, the single fault isolation and the multiple faults isolation. By using the hidden fault set and the masking fault set concept, M. Shakeri et. al proposed a simple algorithm to isolate multiple faults in a complex system. In this paper, we will propose a method of identifying the minimum masking fault set. The method starts with the assumption that a suboptimal sequential single fault diagnosis tree was already obtained, and we will show how to proceed, staring from the parent node consisting of all the possible failure sources, all the way down to obtain the minimum masking fault set at each final leaf node. We give two examples in the paper to verify our proposed method. We first use the example given by K.R. Pattipati et. al to find the minimum masking fault set at each individual leaf node, the result is then compared with that obtained by M. Shakeri et. al. It is shown that our result is consistent with that obtained by M. Shakeri et. al. In the second example, we apply our method to a more complicated model, and employ the sequential single fault diagnosis tree generated by TEAMS Engineering tool from Qualtech Systems Inc., which is able to provide masking fault set information as well. We thus determine the minimum masking fault set for the isolated failure source using our proposed method, and compare the result with that obtained by TEAMS Engineering tool.
Keywords
fault diagnosis; trees (mathematics); TEAMS Engineering tool; complex systems; failure sources; fault isolation; hidden fault set; leaf node; masking fault sets; parent node; suboptimal sequential single fault diagnosis tree; Fault diagnosis; Fault trees; Metrology; Sequential analysis; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Autotestcon, 2006 IEEE
Conference_Location
Anaheim, CA
ISSN
1088-7725
Print_ISBN
1-4244-0051-1
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2006.283733
Filename
4062446
Link To Document