DocumentCode :
32440
Title :
Exploiting Negative Differential Resistance in Monolayer Graphene FETs for High Voltage Gains
Author :
Grassi, Roberto ; Gnudi, A. ; Di Lecce, Valerio ; Gnani, Elena ; Reggiani, S. ; Baccarani, G.
Author_Institution :
E. De Castro Adv. Res. Center on Electron. Syst., Univ. of Bologna, Bologna, Italy
Volume :
61
Issue :
2
fYear :
2014
fDate :
Feb. 2014
Firstpage :
617
Lastpage :
624
Abstract :
Through self-consistent quantum transport simulations, we evaluate the RF performance of monolayer graphene field-effect transistors in the bias region of negative output differential resistance. We show that, compared with the region of quasi-saturation, a voltage gain larger than 10 can be obtained, at the cost of a decrease in the maximum oscillation frequency of about a factor of 1.5-3 and the need for a careful circuit stabilization.
Keywords :
field effect transistors; graphene; negative resistance; bias region; field effect transistor; high voltage gains; maximum oscillation frequency; monolayer graphene FET; negative output differential resistance; quantum transport simulation; quasi saturation region; Circuit stability; Gain; Graphene; Logic gates; Radio frequency; Resistance; Stability analysis; Graphene field-effect transistor (GFET); negative differential resistance (NDR); terahertz operation; voltage amplifier;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2013.2294113
Filename :
6689297
Link To Document :
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