DocumentCode :
3244230
Title :
Triple Modular Redundancy with Standby (TMRSB) Supporting Dynamic Resource Reconfiguration
Author :
Zhang, Kening ; Bedette, Guy ; DeMara, Ronald F.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Central Florida, Orlando, FL
fYear :
2006
fDate :
18-21 Sept. 2006
Firstpage :
690
Lastpage :
696
Abstract :
A fault tolerance model called triple modular redundancy with standby (TMRSB) is developed which combines the two popular fault tolerance techniques of triple modular redundancy (TMR) and standby (SB) fault tolerance. In TMRSB systems, each module of a TMR arrangement has access to several independent standby configurations. When a fault is detected in a module´s active configuration, the physical resources within that module are re-mapped to restore the desired fault-free functionality by reconfiguring the resource pool to one of the standby configurations. A mathematic model for TMRSB systems is developed for field programmable gate array (FPGA) logic devices. Simulation of the model was also performed using the BlockSim reliability software tool which takes into account the reconfiguration time overheads and an imperfect switching mechanism. With component time-to-failure following an exponential distribution throughout long mission duration, the range of operation over which TMRSB is superior to a standby system and a TMR system is shown.
Keywords :
electronic engineering computing; fault tolerance; field programmable gate arrays; reliability; BlockSim reliability software tool; dynamic resource reconfiguration; exponential distribution; fault tolerance model; fault-free functionality; field programmable gate array logic devices; imperfect switching mechanism; reconfiguration time overheads; triple modular redundancy with standby; Exponential distribution; Fault detection; Fault tolerance; Field programmable gate arrays; Logic devices; Mathematical model; Mathematics; Programmable logic arrays; Redundancy; Software tools;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
1-4244-0051-1
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2006.283750
Filename :
4062463
Link To Document :
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