• DocumentCode
    3244271
  • Title

    A Boundary-Scan Solution for Remote System Monitoring, Testing and Configuration Via Inherent Secure Wired or Wireless Communication Protocols

  • Author

    Sparks, Anthony ; van Houcke, M. ; Reis, Likka

  • Author_Institution
    JTAG Technol., San Diego, CA
  • fYear
    2006
  • fDate
    18-21 Sept. 2006
  • Firstpage
    704
  • Lastpage
    712
  • Abstract
    The IEEE 1149.1 Boundary-Scan standard has become an invaluable tool for testing today´s complex, high density digital designs. Although typically used to detect structural faults at board level test, access to the Boundary-Scan infrastructure at the system level enables such capabilities as system monitoring, system test after final assembly and system reconfiguration. To exploit these capabilities, one must have access to the internal Boundary-Scan infrastructure, which is becoming increasingly difficult with the miniaturization of products, shielding requirements and security concerns that prevent external access via the edge connector to the necessary test signals. Subsequently, it has become imperative that an alternative solution be found to gain access to the internal Boundary-Scan infrastructure. This paper will describe a solution to overcome these obstacles by providing remote access to a target system´s internal Boundary-Scan infrastructure utilizing the existing, secure, wired or wireless communication protocol.
  • Keywords
    boundary scan testing; protocols; radio networks; IEEE 1149.1 boundary-scan standard; boundary-scan solution; internal boundary-scan infrastructure; remote system monitoring; security concerns; structural faults; system test; wired communication protocols; wireless communication protocols; Automatic testing; Built-in self-test; Connectors; Electronic equipment testing; Logic testing; Remote monitoring; Signal design; System testing; Wireless application protocol; Wireless communication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2006 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    1-4244-0051-1
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2006.283752
  • Filename
    4062465