DocumentCode :
3244598
Title :
Boundary Scan for Structural Board Test on LXI Platform
Author :
Ehrenberg, Heiko ; Wenzel, Thomas
Author_Institution :
GOEPEL Electron. LLC, Austin, TX
fYear :
2006
fDate :
18-21 Sept. 2006
Firstpage :
789
Lastpage :
794
Abstract :
JTAG/Boundary Scan tools for LXI1 allow a powerful and flexible combination with other test methodologies. This paper shortly discusses benefits and shortcomings of JTAG/Boundary Scan and Functional Test and then outlines possibilities of integrating Boundary Scan tools in a LXI based test environment. Advantages of such a combination of Boundary Scan and Functional Test equipment are illustrated. Furthermore, an introduction to JTAG/ Boundary Scan related Design-For-Testability will be provided.
Keywords :
boundary scan testing; design for testability; JTAG/boundary scan tools; LAN extension for instrumentation; LXI based test environment; design for testability; functional test equipment; structural board test; Automatic programming; Automatic testing; Circuit testing; Electronic equipment testing; Local area networks; Logic programming; Logic testing; Manufacturing; System testing; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
1-4244-0051-1
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2006.283765
Filename :
4062478
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3244598
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