Title :
Improvements to the multi-band ofdm physical layer
Author :
Batra, Anuj ; Balakrishnan, Jaiganesh
Keywords :
Bandwidth; Digital signal processing; Instruments; Noise robustness; OFDM; Physical layer; Switches; Time frequency analysis; Ultra wideband communication; Wireless communication;
Conference_Titel :
Consumer Communications and Networking Conference, 2006. CCNC 2006. 3rd IEEE
Print_ISBN :
1-4244-0085-6
DOI :
10.1109/CCNC.2006.1593129
