Title :
A study on optical observation of electronic conduction phenomena in liquids
Author :
Yoshida, T. ; Yamada, T. ; Makishima, K. ; Sone, M. ; Murooka, Y.
Author_Institution :
Dept. of Eng., Musashi Inst. of Technol., Tokyo, Japan
Abstract :
Investigating optically the process of conduction to breakdown in liquids, there is a question question how to precisely measure tiny bubbles whose size is smaller than the wavelength of light, because the behavior of tiny bubbles produced due to the movement of electrons perform an important role of breakdown criterion. Based on the fact that the light is a kind of electromagnetic wave, we have studied the problem by replacing a tiny bubble and light with a transparency tiny material and a mm electromagnetic wave, respectively, under the similarity law. And then, scattering and refraction of mm-wave due to a dielectric material have been investigated theoretically and experimentally together with 3-dimensional analysis based on geometric optics. From a series of these experiments, we succeeded to experimentally observe a new scattering character which could not be recognized by both Mie theory and geometric optics
Keywords :
bubbles; dielectric liquids; electric breakdown; electrical conductivity; electromagnetic wave refraction; electromagnetic wave scattering; geometrical optics; microwave measurement; millimetre waves; Mie theory; breakdown; breakdown criterion; dielectric material; electromagnetic wave; electron movement; electronic conduction phenomena; geometric optics; liquids; mm electromagnetic wave; optical observation; refraction; scattering; scattering character; similarity law; three-dimensional analysis; tiny bubbles; transparency; wavelength; Dielectric materials; Electric breakdown; Electromagnetic scattering; Electron optics; Geometrical optics; Light scattering; Liquids; Mie scattering; Optical refraction; Optical scattering;
Conference_Titel :
Dielectric Liquids, 1999. (ICDL '99) Proceedings of the 1999 IEEE 13th International Conference on
Conference_Location :
Nara
Print_ISBN :
0-7803-4759-5
DOI :
10.1109/ICDL.1999.798940