DocumentCode :
3245423
Title :
The scope of the strain gage principle
Author :
Bethe, Ing Klaus
Author_Institution :
Inst. fuer Elektrische Messtechnik und Grundlagen der Elektrotechnik, Tech. Univ Braunschweig, West Germany
fYear :
1989
fDate :
8-12 May 1989
Firstpage :
42460
Lastpage :
13940
Abstract :
The 50-year-old strain-gage principle has found widespread application in the measurement of dynamometric quantities; i.e., sensors for force/mass, pressure, torque, or acceleration. It further plays an important role in the measurement of such geometric quantities as displacement and level. About 50% of all sensors (by value) rely on the strain-gage principle. A very important second application of strain gages is the experimental stress analysis of structural parts. The piezoresistive effect can be described by a gage factor k resulting from a geometric effect plus a stress-induced modulation of the electric-field charge transport. These gage factors range from near 2 in metals to more 100 in semiconductors. On this basis, a broad spectrum of sensors can be realized, reaching from the especially tailored super-precision transfer-load cell (maximum error 2×10 -5, diameter 25 cm, price $25000) down to a mass-produced tiny monolithic silicon pressure sensor (error 1%, diameter 6 mm, price $5)
Keywords :
mechanical variables measurement; strain gauges; stress analysis; acceleration; dynamometric quantities; force; mass; piezoresistive effect; pressure; sensors; strain gage principle; stress analysis; torque; Acceleration; Accelerometers; Capacitive sensors; Displacement measurement; Force measurement; Force sensors; Piezoresistance; Pressure measurement; Stress; Torque measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
CompEuro '89., 'VLSI and Computer Peripherals. VLSI and Microelectronic Applications in Intelligent Peripherals and their Interconnection Networks', Proceedings.
Conference_Location :
Hamburg
Print_ISBN :
0-8186-1940-6
Type :
conf
DOI :
10.1109/CMPEUR.1989.93402
Filename :
93402
Link To Document :
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