• DocumentCode
    3245942
  • Title

    The dielectric relaxation studies in liquid crystals

  • Author

    Johri, G.K. ; Johri, Manoj ; Srivststava, R. ; Roberts, J.A.

  • Author_Institution
    Dept. of Phys. & Electron., DAV Coll., Kanpur, India
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    567
  • Lastpage
    570
  • Abstract
    Experimental studies of the dielectric response in liquid crystals at different temperatures have been performed using a microwave cavity spectrometer. The data on the width of the resonant profile and the shift of the resonant frequency observed are analysed to determine permittivity, dielectric loss, and relaxation time mechanism. The relative variation of the dielectric loss has been measured at different temperatures to monitor the phase changes. This work provides useful information about the macroscopic structure of the liquid crystals
  • Keywords
    dielectric losses; dielectric relaxation; liquid crystal phase transformations; molecular orientation; nematic liquid crystals; permittivity; HCB; PCB; dielectric loss; dielectric response; liquid crystals; macroscopic structure; microwave cavity spectrometer; nematic phase; permittivity; phase changes; relaxation time mechanism; resonant frequency shift; resonant profile width; temperature dependence; Dielectric liquids; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Electrochemical impedance spectroscopy; Liquid crystals; Permittivity; Resonance; Resonant frequency; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dielectric Liquids, 1999. (ICDL '99) Proceedings of the 1999 IEEE 13th International Conference on
  • Conference_Location
    Nara
  • Print_ISBN
    0-7803-4759-5
  • Type

    conf

  • DOI
    10.1109/ICDL.1999.798998
  • Filename
    798998