DocumentCode :
3246159
Title :
Color and texture for corn seed classification by machine vision
Author :
Kiratiratanapruk, Kantip ; Sinthupinyo, Wasin
Author_Institution :
Nat. Electron. & Comput. Technol. Center, Nat. Sci. & Technol. Dev. Agency, Pathumthani, Thailand
fYear :
2011
fDate :
7-9 Dec. 2011
Firstpage :
1
Lastpage :
5
Abstract :
Machine vision has been applied to various food materials inspection process of agricultural industry in order to achieve fast and accurate operation. In this paper, we proposed a method to classify more than ten categories of seed defects by using color, texture features and support vector machine (SVM) type classifier. We also developed an image capturing machine that is able to support large volume of seed samples. The image capturing machine was designed to control uncertainty light level, reflection and shadow appeared on seed samples. Therefore, quality of images that can be obtained from the machine in term of accurate color and exposure is high. In addition, the designed image capturing machine also provides support to background subtraction and touching object segmentation processes. In the image classification part, color histograms in RGB and HSV color space together with texture based on Grey level co-occurrence matrix (GLCM) and Local binary pattern (LBP) is adopted as features. The proposed systems were evaluated from more than 10,000 sample images. The obtained accuracies are 95.6% for normal seed type and 80.6% for group of defect seed types. The preliminary results of this study are useful information for future development of the quality control technique in practical usage.
Keywords :
agricultural products; automatic optical inspection; computer vision; grey systems; image classification; image segmentation; production engineering computing; quality control; support vector machines; SVM classifier; agricultural industry; color histograms; corn seed color classification; corn seed texture classification; food materials; grey level cooccurrence matrix; image capturing machine; image classification; image quality; image segmentation; inspection; local binary pattern; machine vision; quality control; seed defects; support vector machine; Physics; Classification; Color; Corn; Grain; Image Processing; SVM; Seed; Texture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Signal Processing and Communications Systems (ISPACS), 2011 International Symposium on
Conference_Location :
Chiang Mai
Print_ISBN :
978-1-4577-2165-6
Type :
conf
DOI :
10.1109/ISPACS.2011.6146100
Filename :
6146100
Link To Document :
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