An analysis of the probability distributions of charge in electrical trees generated by needle tests

Author

Bozzo, R. ; Contin, A. ; Gemme, C. ; Guastavino, F. ; Montanari, G.C.

Author_Institution

DIE, Genoa Univ., Italy

Volume

2

fYear

1996

fDate

20-23 Oct 1996

Firstpage

770

Abstract

The problem of the stochastic description of the time to tree growth in insulation systems is addressed in this paper. Resorting to tests performed by the classic needle-plane configuration, it is shown that, depending on the amplitude of applied voltage and the growth time, data fit well either a two-parameter or a five-parameter Weibull function, but the former can be considered as the most representative of the investigated phenomenon. The values of the parameters of the Weibull function are connected with the shape of the tree, as well as its time evolution and applied electrical field, thus providing a useful tool for insulation characterization

Keywords

Weibull distribution; XLPE insulation; insulation testing; partial discharges; trees (electrical); 20 C; 9 to 11 kV; XLPE; applied voltage amplitude; charge probability distributions; electrical trees; five-parameter Weibull function; growth time; insulation characterization; insulation systems; needle tests; needle-plane configuration; partial discharge height distributions; phase resolved partial discharge analysis; stochastic description; time to tree growth; tree shape; treeing test; two-parameter Weibull function; Aging; Dielectrics and electrical insulation; Materials testing; Needles; Partial discharges; Performance evaluation; Shape; System testing; Trees - insulation; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on

Conference_Location

Millbrae, CA

Print_ISBN

0-7803-3580-5

Type

conf

DOI

10.1109/CEIDP.1996.564622

Filename

564622