Title :
Electron impact excitation and ionization in liquids
Author_Institution :
Inst. of High Temp., Acad. of Sci., Moscow, Russia
Abstract :
The paper deals with evaluation of impact ionization coefficients in noble liquids over a wide range of elevated reduced electric fields up to ~103 Td. Two electron assisted mechanisms are assumed to contribute to the ionization process. The first one is due to electron impact immediately, while the second mechanism primarily involves forming an exciton followed by an ionizing collision with a free unexcited particle. As a result, the upper and lower limits for ionization coefficients in a liquid can be assessed depending on whether or not account is taken of associative ionization. Using the free electron energy distribution function, the ionization coefficients are determined by analytically solving the electron kinetic Boltzmann equation allowing for liquid structure and density effects. Simple analytical expressions are derived for the impact excitation and ionization rates at high electric fields. Also presented is the relation between the density of impact-produced electrons and the specific energy released in the bulk of the liquid
Keywords :
Boltzmann equation; dielectric liquids; electron avalanches; electron impact excitation; electron impact ionisation; excitons; impact ionisation; inert gases; associative ionization; density effects; electric field range; electron assisted mechanisms; electron avalanches; electron impact excitation; electron impact ionization; electron kinetic Boltzmann equation; exciton; free electron energy distribution function; free unexcited particle; impact ionization coefficients; impact-produced electron density; ionizing collision; liquid structure effects; noble liquids; specific energy release; Boltzmann equation; Distribution functions; Electrons; Excitons; Gases; Impact ionization; Kinetic theory; Liquids; Temperature distribution; Voltage;
Conference_Titel :
Dielectric Liquids, 1999. (ICDL '99) Proceedings of the 1999 IEEE 13th International Conference on
Conference_Location :
Nara
Print_ISBN :
0-7803-4759-5
DOI :
10.1109/ICDL.1999.799025