DocumentCode :
3246546
Title :
Fault-tolerance of a neural network solving the TSP
Author :
Protzel, Peter ; Palumbo, D. ; Arras
Author_Institution :
NASA Langley Res. Center, Hampton, VA, USA
fYear :
1989
fDate :
0-0 1989
Abstract :
Summary form only given, as follows. Results are presented of a fault-injection experiment that simulates a neural network solving the traveling salesman problem (TSP). The network is based on a modified version of Hopfield´s and Tank´s original method. The authors define a performance characteristic for the TSP that allows an overall assessment of the solution quality for different city distributions and problem sizes. Five different 10-, 20-, and 30-city cases are used for the injection of up to 13 simultaneous stuck-at-0 and stuck-at-1 faults. The results of more than 4000 simulation runs show the extreme fault tolerance of the network, especially with respect to stuck-at-0 faults. One possible explanation for the overall surprising result is the redundancy of the problem representation.<>
Keywords :
fault tolerant computing; neural nets; operations research; virtual machines; Hopfield-Tank network; fault tolerance; fault-injection experiment; neural network; operations research; redundancy; stuck-at-0 faults; stuck-at-1 faults; traveling salesman problem; Computer fault tolerance; Neural networks; Operations research; Virtual computers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks, 1989. IJCNN., International Joint Conference on
Conference_Location :
Washington, DC, USA
Type :
conf
DOI :
10.1109/IJCNN.1989.118369
Filename :
118369
Link To Document :
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