• DocumentCode
    3246546
  • Title

    Fault-tolerance of a neural network solving the TSP

  • Author

    Protzel, Peter ; Palumbo, D. ; Arras

  • Author_Institution
    NASA Langley Res. Center, Hampton, VA, USA
  • fYear
    1989
  • fDate
    0-0 1989
  • Abstract
    Summary form only given, as follows. Results are presented of a fault-injection experiment that simulates a neural network solving the traveling salesman problem (TSP). The network is based on a modified version of Hopfield´s and Tank´s original method. The authors define a performance characteristic for the TSP that allows an overall assessment of the solution quality for different city distributions and problem sizes. Five different 10-, 20-, and 30-city cases are used for the injection of up to 13 simultaneous stuck-at-0 and stuck-at-1 faults. The results of more than 4000 simulation runs show the extreme fault tolerance of the network, especially with respect to stuck-at-0 faults. One possible explanation for the overall surprising result is the redundancy of the problem representation.<>
  • Keywords
    fault tolerant computing; neural nets; operations research; virtual machines; Hopfield-Tank network; fault tolerance; fault-injection experiment; neural network; operations research; redundancy; stuck-at-0 faults; stuck-at-1 faults; traveling salesman problem; Computer fault tolerance; Neural networks; Operations research; Virtual computers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 1989. IJCNN., International Joint Conference on
  • Conference_Location
    Washington, DC, USA
  • Type

    conf

  • DOI
    10.1109/IJCNN.1989.118369
  • Filename
    118369