Title :
Integrated interconnect circuit modeling for VLSI design
Author :
Jung, Won-Young ; Cha, Ghun-Up ; Kim, Young-Bae ; Baek, Jun-Ho ; Kim, Choon-Kyung
Author_Institution :
LG Semicon Co. Ltd., Seoul, South Korea
fDate :
29 Aug-1 Sep 1995
Abstract :
An integrated interconnect modelling system, SIMS, is developed with parametrized modeling of interconnect and an interface with schematic capture and editor. SIMS automatically drives numerical interconnect simulation as directed by technology engineers, creates a polynomial model library for interconnect parasitics, generates a netlist including the SPICE model for the interconnect structure, automatically drives circuit simulations and displays the simulation results through an advanced GUI. VLSI design with SIMS makes it possible to consider parasitic effects fast and accurately, which becomes more important in deep submicron circuit design. With this capability, circuit design with optimized interconnect layout can be achieved. Ultimately, the integrated system helps to reduce the cost of technology development and the time to market by building up the concept of design for manufacturability
Keywords :
SPICE; VLSI; circuit analysis computing; integrated circuit design; SIMS; SPICE Interconnect Modeling System; SPICE model; VLSI design; advanced GUI; circuit simulations; deep submicron circuit design; design for manufacturability; integrated interconnect circuit modeling; interconnect parasitics; netlist; numerical interconnect simulation; optimized interconnect layout; parametrized modeling; parasitic effects; polynomial model library; schematic capture; technology development; technology engineers; time to market; Circuit simulation; Circuit synthesis; Drives; Integrated circuit interconnections; Integrated circuit technology; Libraries; Numerical simulation; Polynomials; SPICE; Very large scale integration;
Conference_Titel :
Design Automation Conference, 1995. Proceedings of the ASP-DAC '95/CHDL '95/VLSI '95., IFIP International Conference on Hardware Description Languages. IFIP International Conference on Very Large Scal
Conference_Location :
Chiba
Print_ISBN :
4-930813-67-0
DOI :
10.1109/ASPDAC.1995.486218