DocumentCode
3247178
Title
Color plane slicing and its applications to motion characterization for machine vision
Author
Varun, A.V. ; Arya, Sudhanshu ; Bagaria, Venkatesh ; Jhunjhunwala, Harsha ; Madhuri, G.P. ; Varghese, Zubin
Author_Institution
Siemens Corp. Technol., India
fYear
2009
fDate
14-17 July 2009
Firstpage
590
Lastpage
594
Abstract
In this paper we propose the color plane slicing method, a technique to achieve a higher temporal resolution of a phenomena of interest than what is typically achievable by cameras. This is done by using a color camera and strobe lights of different colors at small intervals of time apart. The method, although simple, poses several advantages and applications to machine vision sensors which currently only inspect objects but do not characterize their motion in the context of automation and inspection. Although, the color information is traded for temporal information, we show that the framework is not restrictive for objects with or without colors. Also, the system can continue to be used as a traditional camera for quality inspection with a local translation applied to the formed composite image. Further, potential applications are discussed wherein the system is appended to an industrial grade Smart camera for ease of use. The applicability of the technique is also shown for motion characterization and vibration measurement.
Keywords
cameras; computer vision; image colour analysis; image motion analysis; image sensors; color camera; color information; color plane slicing; machine vision sensor; motion characterization; quality inspection; smart camera; strobe light; vibration measurement; Acceleration; Assembly; Automation; Inspection; Intelligent sensors; Machine vision; Sensor phenomena and characterization; Smart cameras; Velocity measurement; Vibration measurement; Color plane Slicing; Machine Vision; Smart camera; Speed measurement; Vibration Measurement; motion characterization;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Intelligent Mechatronics, 2009. AIM 2009. IEEE/ASME International Conference on
Conference_Location
Singapore
Print_ISBN
978-1-4244-2852-6
Type
conf
DOI
10.1109/AIM.2009.5229947
Filename
5229947
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