• DocumentCode
    3247529
  • Title

    Implications of non-constant clock drifts for the timestamps of concurrent events

  • Author

    Becker, Daniel ; Rabenseifner, Rolf ; Wolf, Felix

  • Author_Institution
    Julich Supercomput. Centre, Forschungszentrum Julich, Julich
  • fYear
    2008
  • fDate
    Sept. 29 2008-Oct. 1 2008
  • Firstpage
    59
  • Lastpage
    68
  • Abstract
    To support the development of efficient parallel codes on cluster systems, event tracing is a widely used technique with a broad spectrum of applications ranging from performance analysis, performance prediction and modeling to debugging. Usually, events are recorded along with the time of their occurrence to measure the temporal distance between them and/or to establish a total event ordering. Obviously, measuring the time between concurrent events requires a global clock, which often, however, is not available on clusters. Assuming that potentially different drifts of local clocks remain constant over time, linear offset interpolation can be applied postmortem to map local onto global timestamps. In this study, we investigate the robustness of the above assumption using different timers and show that the error of timestamps derived in this way can easily lead to a misrepresentation of the logical event order imposed by the semantics of the underlying communication substrate. We conclude that linear offset interpolation alone may be insufficient for many applications of event tracing and discuss further options.
  • Keywords
    clocks; concurrency control; interpolation; parallel processing; workstation clusters; cluster system; concurrent event; event tracing; linear offset interpolation; nonconstant clock drifts; parallel code; timestamps; total event ordering; Application software; Clocks; Concurrent computing; Debugging; Interpolation; Performance analysis; Predictive models; Robustness; Synchronization; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Cluster Computing, 2008 IEEE International Conference on
  • Conference_Location
    Tsukuba
  • ISSN
    1552-5244
  • Print_ISBN
    978-1-4244-2639-3
  • Electronic_ISBN
    1552-5244
  • Type

    conf

  • DOI
    10.1109/CLUSTR.2008.4663756
  • Filename
    4663756